Optical second-harmonic generation measurement for probing organic device operation

Second Harmonic Generation from Organic Optical Waveguides on Diffraction Gratings

We present experimental results of second harmonic generation using a waveguide of PUSC deposited on a silver diffraction grating. The reflected second harmonic signal is enhanced at the angles of resonant excitation of the guided modes or of the surface plasmon. At these angles, we observe unexpected minima in the second harmonic signal, when the second harmonic frequency is situated within th...

Probing and modeling of carrier motion in organic devices by electric-field-induced optical second-harmonic generation

Optical second harmonic generation chiral spectroscopy.

Chiral spectroscopic study: The intensities of second harmonic generation chiral spectroscopy are obtained from the dispersion of the nonlinear optical susceptibility components, as a function of wavelength for helicenbisquinone thin films (see figure). A single formalism fits all the data simultaneously, and the findings constitute an important milestone towards the development of a new experi...

Optical second harmonic generation properties of BiB3O6.

We present studies of the optical properties of the new nonlinear material BiB3O6 for second harmonic generation from the visible to infrared. We have determined the phase-matching conditions and effective nonlinear coefficients in the three principal optical planes, acceptance bandwidths, spatial and temporal walkoff, group velocity dispersion and double phase-matching behaviour. We also repor...

Probing symmetry properties of few-layer MoS2 and h-BN by optical second-harmonic generation.

We have measured optical second-harmonic generation (SHG) from atomically thin samples of MoS2 and h-BN with one to five layers. We observe strong SHG from materials with odd layer thickness, for which a noncentrosymmetric structure is expected, while the centrosymmetric materials with even layer thickness do not yield appreciable SHG. SHG for materials with odd layer thickness was measured as ...